| Συγγραφείς: | Kavousianos X., Chakrabarty K., Kalligeros E., Tenentes V. |
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| Τίτλος: | "Defect Coverage-Driven Window-Based Test Compression" |
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| Συνέδριο: | IEEE Asian Test Symposium (ATS) |
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| Editors: | |
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| Ed: | Όχι |
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| Eds: | Όχι |
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| Σελίδες: | 141-146 |
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| Να εμφανιστεί: | Όχι |
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| Μήνας: | Δεκέμβριος |
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| Έτος: | 2010 |
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| Τόπος: | |
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| Εκδότης: | |
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| Δεσμός: | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5692237 |
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| Όνομα αρχείου: | |
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| Περίληψη: | Although LFSR reseeding based on test cubes for
modeled faults is an efficient test compression approach, it suffers
from the drawback of limited, and often unpredictable,
coverage of unmodeled defects. We present a new defect coverage-driven window-based LFSR reseeding technique, which
offers both high test quality and high compression. The efficiency
of the proposed encoding technique in detecting defects is
boosted by an efficient "output deviations" metric for grading
the calculated LFSR seeds. We show that, compared to standard
compression-driven LFSR reseeding, higher defect coverage
is obtained without any loss of compression. |
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English