| Συγγραφείς: | Kalligeros E., Kavousianos X., Nikolos D. |
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| Τίτλος: | "Efficient Multiphase Test Set Embedding for Scan-based Testing" |
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| Συνέδριο: | International Symposium on Quality Electronic Design (ISQED) |
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| Editors: | |
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| Ed: | Όχι |
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| Eds: | Όχι |
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| Σελίδες: | 433-438 |
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| Να εμφανιστεί: | Όχι |
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| Μήνας: | Μάρτιος |
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| Έτος: | 2006 |
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| Τόπος: | |
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| Εκδότης: | |
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| Δεσμός: | http://dl.acm.org/ft_gateway.cfm?id=1126790&ftid=368908&dwn=1&CFID=264353496&CFTOKEN=33288925 |
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| Όνομα αρχείου: | |
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| Περίληψη: | In this paper a new test set embedding method with reseeding
for scan-based testing is proposed. The bit sequences
of multiple cells of an LFSR, which is used as test pattern
generator, are exploited for effectively encoding the test set
of the core under test (multiphase architecture). A new algorithm
which comprises four heuristic criteria is introduced
for efficiently selecting the required seeds and LFSR cells.
Also, a cost metric for assessing the quality of the algorithm's
results is proposed. By using this metric, the process of determining
proper values for the algorithm's input parameters
is significantly simplified. The proposed method compares
favorably with the most recent and effective test set embedding
techniques in the literature. |
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English