| Συγγραφείς: | Kavousianos X., Tenentes V., Chakrabarty K., Kalligeros E. |
|---|
| Τίτλος: | "Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets" |
|---|
| Περιοδικό: | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
|---|
| Volume: | 19 |
|---|
| Αριθμός: | 12 |
|---|
| Σελίδες: | 2330-2335 |
|---|
| Έτος: | 2011 |
|---|
| Εκδότης: | |
|---|
| Να εμφανιστεί: | Όχι |
|---|
| Δεσμός: | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5613231 |
|---|
| ISI: | Όχι |
|---|
| Impact Factor: | |
|---|
| Όνομα αρχείου: | |
|---|
| Περίληψη: | Defect screening is a major challenge for nanoscale CMOS
circuits, especially since many defects cannot be accurately modeled using
known fault models. The effectiveness of test methods for such circuits can
therefore be measured in terms of the coverage obtained for unmodeled
faults. In this paper, we present a new defect-oriented dynamic LFSR reseeding technique for test-data compression. The proposed technique is
based on a new output-deviation metric for grading stuck-at patterns derived from LFSR seeds. We show that, compared to standard compression-driven dynamic LFSR reseeding and a previously proposed deviation-based method, higher defect coverage is obtained using stuck-at test cubes
without any loss of compression. |
|---|
English