| Συγγραφείς: | Bakalis D., Kalligeros E., Nikolos D., Vergos H., Alexiou G. |
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| Τίτλος: | "On the design of low power BIST for multipliers with Booth encoding and Wallace tree summation" |
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| Περιοδικό: | Journal of Systems Architecture |
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| Volume: | 48 |
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| Αριθμός: | 4 |
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| Σελίδες: | 125-135 |
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| Έτος: | 2002 |
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| Εκδότης: | Elsevier |
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| Να εμφανιστεί: | Όχι |
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| Δεσμός: | http://www.sciencedirect.com/science/article/pii/S1383762102001212 |
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| ISI: | Όχι |
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| Impact Factor: | |
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| Όνομα αρχείου: | |
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| Περίληψη: | Low power dissipation (PD) during testing is emerging as one of the major objectives of a built-in self-test (BIST)
designer. In this paper we examine the testability of multipliers based on Booth encoding and Wallace tree summation
of the partial products and we present a methodology for deriving a low power BIST scheme for them. We propose
several design rules for designing the Wallace tree in order to be fully testable under the cell fault model. The proposed
low power BIST scheme for the derived multipliers is achieved by: (a) introducing suitable test pattern generators
(TPGs), (b) properly assigning the TPG outputs to the multiplier inputs and (c) significantly reducing the test set length.
Results indicate that the total power dissipated, the average power per test vector and the peak PD during testing can be
reduced up to 73%, 27% and 36% respectively with respect to earlier schemes, depending on the implementation of the
basic cells and the size of the multiplier. The test application time is also significantly reduced, while the introduced
BIST scheme implementation area is small. |
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English