| Authors: | Kalligeros E., Kavousianos X., Bakalis D., Nikolos D. |
|---|
| Title: | "On-the-fly Reseeding: A New Reseeding Technique for test-per-clock BIST" |
|---|
| Journal: | Journal of Electronic Testing: Theory and Applications |
|---|
| Volume: | 18 |
|---|
| Number: | 3 |
|---|
| Pages: | 315-332 |
|---|
| Year: | 2002 |
|---|
| Publisher: | Kluwer Academic Publishers (Springer) |
|---|
| To appear: | No |
|---|
| Link: | http://link.springer.com/content/pdf/10.1023%2FA%3A1015039323168.pdf |
|---|
| ISI: | No |
|---|
| Impact Factor: | |
|---|
| File name: | |
|---|
| Abstract: | In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable
for at-speed testing of circuits with random-pattern resistant faults. Our technique eliminates the need of a ROM
for storing the seeds since the reseeding is performed on-the-fly by inverting the logic value of some of the bits of
the next state of the Test Pattern Generator (TPG). The proposed reseeding technique is generic and can be applied
to TPGs based on both Linear Feedback Shift Registers (LFSRs) and accumulators. An efficient algorithm for
selecting reseeding points is also presented, which targets complete fault coverage and allows to well exploiting
the trade-off between hardware overhead and test length. Using experimental results we show that the proposed
method compares favorably to the other already known techniques with respect to test length and the hardware
implementation cost. |
|---|
Greek