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Conference

Authors:	Gekas G., Nikolos D., Kalligeros E., Kavousianos X.
Title:	"Power Aware Test-Data Compression for Scan-based Testing"
Conference:	IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Editors:
Ed:	No
Eds:	No
Pages:
To appear:	No
Month:	December
Year:	2005
Place:
Pubisher:
Link:	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4633432
File name:
Abstract:	In this paper a new approach that targets the reduction of both the test-data volume and the scan power during the testing of a core is proposed. For achieving the two aforementioned goals, a novel algorithm that inserts some inverters in the scan chain(s) of the core under test (CUT) is presented. The proposed algorithm targets the maximization of run-lengths of zeros (or ones) in the test set accompanying the CUT, while imposing no performance or area penalty since the negated outputs of the scan flip-flops can be used for performing the necessary inversions. This algorithm combined with the Minimum Transition Count mapping of don't cares in a test set, as well as with the alternating run-length code that have been recently proposed, achieves better test-data compression and reduced scan-power results than the relative works in the literature.