Authors: | Tenentes V., Kavousianos X., Kalligeros E. |
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Title: | "Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores" |
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Journal: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
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Volume: | 29 |
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Number: | 10 |
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Pages: | 1640-1644 |
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Year: | 2010 |
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Publisher: | |
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To appear: | No |
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Link: | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5580216 |
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ISI: | No |
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Impact Factor: | |
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File name: | |
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Abstract: | Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test
application times prohibit their use for testing systems-on-chip
(SoC). To alleviate this problem we present two new types
of linear feedback shift registers (LFSRs), the Single-State-Skip
and the Variable-State-Skip LFSRs. Both are normal LFSRs with
the addition of the State-Skip circuit, which is used instead of the
characteristic-polynomial feedback structure for performing successive
jumps of constant and variable length in their state sequence. By
using Single-State-Skip LFSRs for testing single or multiple identical
cores and Variable-State-Skip LFSRs for testing multiple non-identical
cores we get the well-known high compression efficiency of TSE with
substantially reduced test sequences, thus bridging the gap between test
data compression and TSE methods. |