Journal

Authors: Tenentes V., Kavousianos X., Kalligeros E.
Title: "Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores"
Journal: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume: 29
Number: 10
Pages: 1640-1644
Year: 2010
Publisher:
To appear: No
Link: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5580216
ISI: No
Impact Factor:
File name:
Abstract: Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods.