| Abstract: | We present a new type of Linear Feedback Shift Registers,
State Skip LFSRs. State Skip LFSRs are normal LFSRs with
the addition of a small linear circuit, the State Skip circuit,
which can be used, instead of the characteristic-polynomial
feedback structure, for advancing the state of the LFSR. In
such a case, the LFSR performs successive jumps of constant
length in its state sequence, since the State Skip circuit omits a
predetermined number of states by calculating directly the
state after them. By using State Skip LFSRs we get the well-known
high compression efficiency of test set embedding with
substantially reduced test sequences, since the useless parts
of the test sequences are dramatically shortened by traversing
them in State Skip mode. The length of the shortened test sequences
approaches that of test data compression methods. A
systematic method for minimizing the test sequences of reseeding-based test set embedding methods, and a low overhead
decompression architecture are also presented. |
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