Greek Chapter in Book
| Authors: | Iliadis A. |
|---|---|
| Chapter Title: | High speed circuit reliability |
| Book: | Semiconductor Device Reliability |
| Editors: | A. Christou, B. A. Unger |
| Ed: | No |
| Eds: | Yes |
| Pages: | 491-506 |
| Year: | 1989 |
| Place: | |
| Publisher: | Kluwer Academic Publishers |
| To appear: | No |
| Link: | |
| File name: |