Greek Conference
| Authors: | Scire J., Wagstaffe D., Prenatt M., Iliadis A., Jones K., Wood M., Kirchner K., Zheleva T., Ervin M., Geil B. |
|---|---|
| Title: | Microanalysis of Ni/Si Ohmic Contacts to n-SiC |
| Conference: | International Semiconductor Devices Research Symposium |
| Editors: | |
| Ed: | No |
| Eds: | No |
| Pages: | 224-226 |
| To appear: | No |
| Month: | |
| Year: | 2001 |
| Place: | |
| Pubisher: | |
| Link: | |
| File name: | |
| Abstract: |