| Abstract: | Various efficient compression methods have been proposed
for tackling the problem of increased test-data volume
of contemporary, core-based Systems-on-Chip (SoCs). However,
many of them cannot exploit the test-application-time
advantage that cores with multiple scan chains offer, since
they are not able to perform parallel decompression of the
encoded data. For eliminating this problem, we present a
new, low-overhead decompression scheme that can generate
clusters of test bits in parallel. The test data are encoded
using a recently proposed and very effective compression
method called multilevel Huffman. Thus, apart from the significantly
reduced test-application times, the proposed approach
offers high compression ratios, as well as increased
probability of detection of unmodeled faults, since the majority
of the unspecified bits of the test sets are replaced by
pseudorandom data. The time/space advantages of the proposed
approach are validated by thorough experiments. |
|---|
Greek