| Συγγραφείς: | Kaseridis D., Kalligeros E., Kavousianos X., Nikolos D. |
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| Τίτλος: | "An Efficient Test Set Embedding Scheme with Reduced Test Data Storage and Test Sequence Length Requirements for Scan-based Testing" |
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| Συνέδριο: | Informal Digest of Papers of IEEE European Test Symposium (ETS) |
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| Editors: | |
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| Ed: | Όχι |
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| Eds: | Όχι |
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| Σελίδες: | 147-150 |
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| Να εμφανιστεί: | Όχι |
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| Μήνας: | Μάιος |
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| Έτος: | 2005 |
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| Τόπος: | |
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| Εκδότης: | |
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| Δεσμός: | |
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| Όνομα αρχείου: | ETS05_published.pdf##^^&&109768592.pdf |
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| Περίληψη: | In this paper we present an efficient seed-selection algorithm
for reducing the test-data storage requirements of
scan-based, test set embedding schemes with reseeding.
Moreover, a technique for reducing the length of the generated
test sequences is introduced. This technique achieves
significant savings with minor overhead (one extra bit per
seed plus a small counter in the scheme’s control logic). Experimental
results demonstrate the advantages of the proposed
algorithm and the test sequence reduction technique. |
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English