Greek Journal
| Authors: | Iliadis A., Laih S., Martin E., Ioannou D. |
|---|---|
| Title: | Deep states at the interface between SiO2 and MBE grown InP |
| Journal: | J. Appl. Physics |
| Volume: | 65 |
| Number: | 0 |
| Pages: | 4805-4808 |
| Year: | 1989 |
| Publisher: | |
| To appear: | No |
| Link: | |
| ISI: | No |
| Impact Factor: | |
| File name: | |
| Abstract: |