Greek Journal
| Authors: | Iliadis A., Andronescu S., Yang J., Vispute R., Stanishevsky A., Orloff J., Talyansky V., Sharma R., Venkatesan T., Wood M. |
|---|---|
| Title: | Focused Ion Beam Assisted Ohmic Metallizations to p-6H-SiC |
| Journal: | J. Electronic Materials |
| Volume: | 28 |
| Number: | 3 |
| Pages: | 136-140 |
| Year: | 1999 |
| Publisher: | |
| To appear: | No |
| Link: | |
| ISI: | No |
| Impact Factor: | |
| File name: | |
| Abstract: |