Greek Journal
| Authors: | Huang J., Ioannou D., Iliadis A. |
|---|---|
| Title: | SEM EBIC studies of (In)GaAs grown by MBE |
| Journal: | J. Scan. Electron Microscopy |
| Volume: | 2 |
| Number: | 0 |
| Pages: | 129-132 |
| Year: | 1988 |
| Publisher: | |
| To appear: | No |
| Link: | |
| ISI: | No |
| Impact Factor: | |
| File name: | |
| Abstract: |