| Authors: | Tenentes V., Kavousianos X., Kalligeros E. |
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| Title: | "Shrinking the Application Time of Test Set Embedding by Using Variable-State Skip LFSRs" |
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| Conference: | Informal Digest of Papers of IEEE European Test Symposium (ETS) |
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| Editors: | |
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| Ed: | No |
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| Eds: | No |
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| Pages: | |
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| To appear: | No |
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| Month: | May |
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| Year: | 2008 |
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| Place: | |
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| Pubisher: | |
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| Link: | |
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| File name: | ets08-CD.pdf##^^&&970917649.pdf |
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| Abstract: | It is well-known that the high compression efficiency of test
set embedding is compromised by its long test application times.
To alleviate this problem we present a sophisticated version of
the recently proposed State Skip LFSRs, the Variable-State Skip
(VSS) LFSRs. By using VSS LFSRs successive jumps of variable
lengths can be performed in the state sequence of the LFSRs
and thus the useless parts of the test sequences can be effectively
skipped. A low-overhead decompression architecture,
that overcomes the limitations of simple State Skip LFSRs, is
also proposed. The combination of VSS LFSRs with the proposed
architecture offers the very small test-data volumes of
test set embedding, with drastically shortened test sequences.
Also, in a multi-core environment where a common decompressor
is used, maximum test-sequence-length reduction can be
achieved for every individual IP core that is tested. |
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